Research Title |
Research Type |
Research Year |
Modeling of current-voltage and capacitance-voltage characteristics of pentacene and sol-gel derived SiO2 gate dielectric layer based on thin-film transistor Modeling of current-voltage and capacitance-voltage characteristics of pentacene and sol-gel derived SiO2 gate dielectric layer based on thin-film transistor
ELSEVIER SCIENCE SA, PO BOX 564, 1001 LAUSANNE, SWITZERLAND |
Article In Journal |
1435 |
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