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Document Details
Document Type
:
Article In Journal
Document Title
:
Optical constants for Ge30-xSe70Agx (0 <= x <= 30 at%) thin films based only on their reflectance spectra
Optical constants for Ge30-xSe70Agx (0 <= x <= 30 at%) thin films based only on their reflectance spectra
Subject
:
physics
Document Language
:
English
Abstract
:
In this paper, different homogenous compositions of Ge30-xSe70Agx (0 <= x <= 30 at%) thin films were prepared by thermal evaporation. Reflection spectra, R(lambda), for the films were measured in the wavelength range 400-2500 nm. A straightforward analysis proposed by Minkov [J. Phys. D: Appl. Phys. 22 (1989) p. 1157], based on the maxima and minima of the reflection spectra, allows us to derive the real and imaginary parts of the complex index of refraction and the film thickness of the studied films. Increasing Ag content at the expense of Ge atoms is found to affect the refractive index and the extinction coefficient of the films. The dispersion of the refractive index is discussed in terms of the single-oscillator Wemple-DiDomenico model. Optical absorption measurements were used to obtain the fundamental absorption edge as a function of composition. With increasing Ag content, the refractive index increases while the optical band gap decreases. The compositional dependence of the optical band gap for the Ge30-xSe70Agx (0 <= x <= 30) thin films is discussed in terms of the chemical bond approach
ISSN
:
1478-6435
Journal Name
:
PHILOSOPHICAL MAGAZINE
Volume
:
92
Issue Number
:
8
Publishing Year
:
1433 AH
2012 AD
Article Type
:
Article
Added Date
:
Tuesday, July 25, 2017
Researchers
Researcher Name (Arabic)
Researcher Name (English)
Researcher Type
Dr Grade
Email
K. A Aly,
Aly,, K. A
Investigator
Doctorate
kamalaly2001@gmail.com
D Dahshan
Dahshan, D
Researcher
Doctorate
I.S Yahia
Yahia, I.S
Researcher
Doctorate
Files
File Name
Type
Description
42268.pdf
pdf
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